Description: Secondary Ion Mass Spectrometry
silicon (2) secondary ion mass spectrometry (1) surface analysis (1) depth profile (1) depth profiling (1) trace element analysis (1) semiconductor materials (1) materials characterization (1) compound semiconductor (1) iii-v compound semiconductor (1)
Welcome to QSpec Technology Inc., the dedicated SIMS analytical service laboratory. With a highly experienced team and state-of-the-art instrumentation, we can assist you in enhancing yield and device performance and reduce R&D cycle time. Go ahead. Give us a call. See what we can do for you.
QSpec is the leading SIMS analytical service lab......
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